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Capabilities

Microscopy

EMSL hosts a variety of sophisticated microscopy instruments, including electron microscopes, optical microscopes, scanning probe microscopes, and computer-controlled microscopes for automated particle analysis. These tools are used to image a range of sample types with nanoscale—and even atomic—resolution with applications to surface, environmental, biogeochemical, atmospheric, and biological science. Each state-of-the-art instrument and customized capability is equipped with features for specific applications.

Capability Detail

For a full listing, refer to the "Capabilities" table that links to detailed information about each of EMSL's microscopy instruments. Brief details about the primary microscopy tools available to EMSL users include:

  1. Continuous Precipitation of Ceria Nanoparticles from a Continuous Flow Micromixer.
  2. Effect of combined local variations in elastic and inelastic energylosses on the morphology of tracks in ion-irradiated materials.
  3. Phase Contrast X-ray Imaging Signatures for Security Applications.
  4. Evaluation of selected binding domains for the analysis of ubiquitinated proteomes.
  5. Oxidative Dissolution of UO2 in a Simulated Groundwater Containing Synthetic Nanocrystalline Mackinawite.
  1. Predictive models of environmental reaction kinetics made more accurate, scalable (Scaled up)
  2. Sulfide and iron work together to reveal a new path for radionuclide sequestration (Sulfur cleans up)
  3. Scientists gain first quantitative insights into electron transfer from minerals to microbes (Tunable transfer)
  4. First view of micellar bundles revealed by EMSL electron microscopy tools, techniques (Micelle microscopy)
  5. Biofilms move electrons long distances across two distinct layers, even under starving conditions (Long distance)

Microscopy Capabilities Available at EMSL

Instrument Contact
Electron Microprobe Arey, Bruce
McKinley,James P
Electron Microscope: Dual FIB/SEM (FEI Helios) Arey, Bruce
Electron Microscope: Dual FIB/SEM, Environmental (FEI Quanta) Laskin, Alexander
Lea, Scott
Electron Microscope: Dual FIB/SEM, Environmental for radiological samples (Quanta) Arey, Bruce
Lea, Scott
Electron Microscope: Photoemission (PEEM) Joly, Alan G
Electron Microscope: Transmission, CRYO 2005 Dohnalkova, Alice
Electron Microscope: Transmission, Dynamic - (avail. Jan. 2014) Browning,Nigel D
Evans, James
Electron Microscope: Transmission, Environmental Kabius, Bernd
Kovarik, Libor
Electron Microscope: Transmission, Liquid Helium, Cryo (JEOL) - (avail. Mar. 2013) Evans, James
Electron Microscope: Transmission, Scanning Lea, Scott
Wang, Chongmin
Electron Spectrometer: XPS Imaging Engelhard, Mark
Nandasiri,Manjula I
Mammalian Cell Culture Orr, Galya
Mass Spectrometer: Single Particle (SPLAT II) Zelenyuk, Alla
Microscope: Fluorescence, Single-Molecule Hu, Dehong
Microscope: Fluorescence, Single-Molecule /Patch Clamp Orr, Galya
Microscope: Fluorescence, Super Resolution Structured Illumination Orr, Galya
Microscope: Helium Ion Jiang, Weilin
Lea, Scott
Shutthanandan, Shuttha
Microscope: Scanning Probe, AFM Compound Hu, Dehong
Microscope: Scanning Probe, AFM, Bioscope, Radiological Rosso, Kevin M.
Microscope: Scanning Probe, AFM, Geochemistry Lea, Scott
Rosso, Kevin M.
Microscope: Scanning Probe, Dynamic Force Rosso, Kevin M.
Microscope: Scanning Probe, Scattering IR SNOM Craig, Ian
Lea, Scott
Microscope: Scanning Probe, STM/AFM, Low Temperature, UHV Lyubinetsky, Igor
Microscope: Scanning Probe, STM/AFM, PicoSPM Rosso, Kevin M.
Microscope: Scanning Probe, Variable Temperature Lyubinetsky, Igor
Microscope: Scanning Probe, Variable Temperature UHV Dohnalek, Zdenek
NMR Spectrometer: 500-MHz WB Bruker (Imaging) - (Bastiat) Renslow, Ryan
Spectrometer: Atom Probe Devaraj, Arun
Perea, Daniel
Spectrometer: Fluorescence, Cryogenic Wang, Zheming
Spectrometer: FTIR - standard Johnson, Tim
Spectrometer: High Spatial Resolution Secondary Ion Mass Spectrometry (NanoSIMS) Mahoney, Christine
Zhu, Zihua
Spectrometer: Raman/Epifluorescence, Inverted Confocal Hess, Nancy J.
Spectroscopy: Fluorescence, Time-resolved Wang, Zheming
X-ray Computed Tomography Bowden, Mark
Varga, Tamas
Microscopy Capability Lead: Scott Lea , 509-371-6233