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Capabilities

Spectroscopy and Diffraction

EMSL's suite of spectroscopy and diffraction instruments allows users to study solid-, liquid-, and gas-phase sample structure and composition with remarkable resolution. Ideal for integrated studies, spectrometers and diffractometers are easily coupled with EMSL's computational and modeling capabilities, allowing users to apply a multifaceted research approach for experimental data interpretation and gain fundamental understanding of scientific problems. At EMSL, spectroscopy and diffraction instruments are used to study samples with a variety of applications.

Capability Detail

For a full listing, refer to the "Capabilities" table that links to detailed information about each of EMSL's spectroscopy and diffraction instruments, as well as the appropriate contact(s). Brief details about some primary spectroscopy and diffraction tools available to EMSL users include:

  1. Parallel Implementation of Gamma-Point Pseudopotential Plane-Wave DFT with Exact Exchange.
  2. Cellular Recognition and Trafficking of Amorphous Silica Nanoparticles by Macrophage Scavenger Receptor A.
  3. Growth, microstructure and electrical properties of sputter-deposited hafnium oxide (HfO2) thin films grown using HfO2 ceramic target.
  4. (100) facets of γ-Al2O3: the active surfaces for alcohol dehydration reactions.
  5. Recovery of Iron/Iron Oxide Nanoparticles from Solution: Comparison of Methods and their Effects.
  1. Proteogenomic strategies help refine annotations of three Yersinia strains (Annotating Plague)
  2. EMSL's novel spectroscopy device pairs visual clarity with sub-monolayer sensitivity (Angling for Answers)
  3. Transmission electron microscopy transforms how we see lithium-ion batteries (Not Fade Away)
  4. Novel method yields highly reactive, highly hydroxylated TiO2 surface (Water, Sun, Energy)
  5. Unparalleled time, spectral resolution benefit surface science studies at EMSL (Attention to Detail)

Spectroscopy and Diffraction Capabilities Available at EMSL

Instrument Contact
Atmospheric Pressure Reactor System Tonkyn, Russell
Catalysis: UHV Model Catalysts, High Pressure Szanyi, Janos
Electron and Photon Stimulated Desorption (BES 2) Kimmel, Greg
Electron Spectrometer: HREELS, UHV Surface Chemistry Henderson, Mike
Electron Spectrometer: Scanning Multiprobe Surface Analysis System - Versaprobe Nachimuthu, Ponnusamy
Electron Spectrometer: Scanning XPS Microprobe, High Resolution (Quantera) Engelhard, Mark
Electron Spectrometer: XPS Imaging Engelhard, Mark
Nachimuthu, Ponnusamy
Electron Spectrometer: XPS with Laser Interface Joly, Alan G
Energetic Processes (Surfaces/Solids) Instrumentation w/Lasers Hess, Wayne P
Joly, Alan G
Ion Accelerator, Beam Lines, and End Stations Shutthanandan, Shuttha
Microscope: Helium Ion Jiang, Weilin
Lea, Scott
Shutthanandan, Shuttha
Molecular Beam Kinetics Smith, Scott
Photoelectron Spectrometer: X-Ray, High Sensitivity (for radiological samples) Engelhard, Mark
Nachimuthu, Ponnusamy
Photoelectron Spectroscopy - Low Temperature Joly, Alan G
Spectrometer: Fluorimeter Wang, Zheming
Spectrometer: Mossbauer Kukkadapu, Ravi
Spectrometer: Atom Probe Devaraj, Arun
Thevuthasan, Theva
Spectrometer: Circular Dichroism Hoyt, David
Isern, Nancy
Spectrometer: Fluorescence, Cryogenic Wang, Zheming
Spectrometer: Fluorescence, Picosecond Joly, Alan G
Spectrometer: FTIR - High Resolution Blake, Tom
Spectrometer: FTIR - standard Johnson, Tim
Spectrometer: FTIR/Raman Johnson, Tim
Joly, Alan G
Spectrometer: Raman, Confocal Hess, Nancy J.
Spectrometer: Raman/Epifluorescence, Inverted Confocal Hess, Nancy J.
Spectrometer: Stopped-Flow, Absorbance, BioLOGIC SFM-400 Wang, Zheming
Spectrometer: Sum Frequency/Second Harmonic Generation, Femto-Picosecond, High Resolution, Ultrafast Dynamics Bowden, Mark
Wang, Hongfei
Spectrometer: Sum Frequency/Second Harmonic Generation, Picosecond, Surface Spectroscopy Bowden, Mark
Wang, Hongfei
Spectroscopy: Fluorescence, Time-resolved Wang, Zheming
Transient Kinetic Analysis (TKA) Szanyi, Janos
X-ray Computed Tomography Bowden, Mark
Varga, Tamas
X-ray Diffraction: Four-Circle Bowden, Mark
Varga, Tamas
X-ray Diffraction: General Purpose Bowden, Mark
Varga, Tamas
X-ray Diffraction: Microbeam Bowden, Mark
Varga, Tamas
X-ray Diffraction: Special Applications Bowden, Mark
Varga, Tamas
Spectroscopy and Diffraction Capability Lead (Electron and Ion/Molecular Beam): Theva Thevuthasan | , 509-371-6244
Spectroscopy and Diffraction Capability Lead (Mössbauer, Optical, and X-ray Diffractometer): Mark Bowden | , 509-371-7816