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Capabilities

Spectroscopy and Diffraction

EMSL's suite of spectroscopy and diffraction instruments allows users to study solid-, liquid-, and gas-phase sample structure and composition with remarkable resolution. Ideal for integrated studies, spectrometers and diffractometers are easily coupled with EMSL's computational and modeling capabilities, allowing users to apply a multifaceted research approach for experimental data interpretation and gain fundamental understanding of scientific problems. At EMSL, spectroscopy and diffraction instruments are used to study samples with a variety of applications.

Capability Detail

For a full listing, refer to the "Capabilities" table that links to detailed information about each of EMSL's spectroscopy and diffraction instruments, as well as the appropriate contact(s). Brief details about some primary spectroscopy and diffraction tools available to EMSL users include:

  1. Continuous Precipitation of Ceria Nanoparticles from a Continuous Flow Micromixer.
  2. Phase Contrast X-ray Imaging Signatures for Security Applications.
  3. Oxidative Dissolution of UO2 in a Simulated Groundwater Containing Synthetic Nanocrystalline Mackinawite.
  4. Identification of Fragile Microscopic Structures during Mineral Transformations in Wet Supercritical CO2.
  5. Forsterite [Mg2SiO4)] Carbonation in Wet Supercritical CO2: An in situ High Pressure X-Ray Diffraction Study.
  1. EMSL’s Chinook provides a new angle for validating pore-scale flow simulations (Go with the flow)
  2. EMSL tools reveal morphology, growth mechanisms of precipitates from scCO2 storage (Rods and rosettes)
  3. Micromodels redefine how bubbles characterize CO2 gas flow (Breaking down the bubbly)
  4. Nanoclusters in steel add strength, stability under irradiated conditions (A steel trap)
  5. In silico, in vivo, in vitro approach opens doors for nanoparticle-based drug discovery (Model health)

Spectroscopy and Diffraction Capabilities Available at EMSL

Instrument Contact
Atmospheric Pressure Reactor System Tonkyn, Russell
Catalysis: UHV Model Catalysts, High Pressure Szanyi, Janos
Electron and Photon Stimulated Desorption (BES 2) Kimmel, Greg
Electron Spectrometer: HREELS, UHV Surface Chemistry Henderson, Mike
Electron Spectrometer: Scanning Multiprobe Surface Analysis System - Versaprobe Engelhard, Mark
Flynn,Brendan T
Electron Spectrometer: Scanning XPS Microprobe, High Resolution (Quantera) Engelhard, Mark
Electron Spectrometer: XPS Imaging Engelhard, Mark
Nandasiri,Manjula I
Electron Spectrometer: XPS with Laser Interface Joly, Alan G
Electron Spectrometer: XPS, High Sensitivity (for radiological samples) Engelhard, Mark
Energetic Processes (Surfaces/Solids) Instrumentation w/Lasers Hess, Wayne P
Joly, Alan G
Ion Accelerator, Beam Lines, and End Stations Shutthanandan, Shuttha
Mass Spectrometer: Time of Flight Secondary Ion (ToF SIMS) - 2007 Mahoney, Christine
Zhu, Zihua
Microscope: Helium Ion Jiang, Weilin
Lea, Scott
Shutthanandan, Shuttha
Molecular Beam Kinetics Smith, Scott
Photoelectron Spectroscopy: Low Temperature Joly, Alan G
Spectrometer: Fluorimeter Wang, Zheming
Spectrometer: Atom Probe Devaraj, Arun
Perea, Daniel
Spectrometer: Circular Dichroism Hoyt, David
Isern, Nancy
Spectrometer: Fluorescence, Cryogenic Wang, Zheming
Spectrometer: Fluorescence, Picosecond Joly, Alan G
Spectrometer: FTIR - standard Johnson, Tim
Spectrometer: High Spatial Resolution Secondary Ion Mass Spectrometry (NanoSIMS) Mahoney, Christine
Zhu, Zihua
Spectrometer: Mossbauer Kukkadapu, Ravi
Spectrometer: Raman/Epifluorescence, Inverted Confocal Hess, Nancy J.
Spectrometer: Stopped-Flow, Absorbance, BioLOGIC SFM-400 Wang, Zheming
Spectrometer: Sum Frequency/Second Harmonic Generation, Femto-Picosecond, High Resolution, Ultrafast Dynamics Bowden, Mark
Wang, Hongfei
Spectrometer: Sum Frequency/Second Harmonic Generation, Picosecond, Surface Spectroscopy Bowden, Mark
Wang, Hongfei
Spectroscopy: Fluorescence, Time-resolved Wang, Zheming
Transient Kinetic Analysis (TKA) Szanyi, Janos
X-ray Computed Tomography Bowden, Mark
Varga, Tamas
X-ray Diffraction: Four-Circle Bowden, Mark
Varga, Tamas
X-ray Diffraction: General Purpose Bowden, Mark
Varga, Tamas
X-ray Diffraction: Microbeam Bowden, Mark
Varga, Tamas
X-ray Diffraction: Special Applications Bowden, Mark
Varga, Tamas
Spectroscopy and Diffraction Capability Lead (Electron and Ion/Molecular Beam): Theva Thevuthasan | , 509-371-6244
Spectroscopy and Diffraction Capability Lead (Mössbauer, Optical, and X-ray Diffractometer): Mark Bowden | , 509-371-7816