Office of Science

Electron Microscope: Transmission, High Resolution

JEOL 2010 high-resolution transmission electron microscope (TEM)
In 2006, EMSL brought online a cryo-transmission electron microscope that complements the facility's suite of state-of-the-art microscopes. The electron microscope is customized to accommodate researchers' demands within the fast-growing field of biological imaging at the nano-structural level.

Quick Specs

  • Point-to-point resolution of 0.194 nm
  • Operates in many lens conditions: TEM, EDS, NBED, and CBED
  • Digital image recording with 1024 x 1024 pixel resolution

The JEOL 2010 high-resolution transmission electron microscope (TEM) is capable of a point-to-point resolution of 0.194 nm. The instrument can typically be used to image metals, ceramics, minerals, nanostructured materials, and biological-related materials and tissues at atomic-bond-length resolution. Researchers have used this instrument heavily for work related to spintronics, environmental issues, geophysics and geochemical research, atmospheric research, biological research, and catalysis.

This instrument is equipped with a medium acceleration voltage of 200 kV, a high-brightness electron source, digital image recording, a computer-controlled sample goniometer, and a geometrically optimized X-ray detector. It is also capable of a wide range of illumination lens conditions: TEM mode, energy dispersive spectroscopy (EDS) mode, nanometer beam electron diffraction (NBED), and convergent beam electron diffraction (CBED).

All work with the JEOL 2010 high-resolution TEM must be performed in compliance with EMSL practices and permits.

Performance Specifications

Primarily, the JEOL 2010 high-resolution TEM provides point-to-point resolution (0.194 nm) along with high-energy resolution (136 eV) X-ray EDS, the latter of which can detect elements heavier than beryllium. The instrument uses an LaB6 electron-beam source, and its slow-scan charge-coupled device (CCD) camera allows digital image recording and real-time image analysis.

System Configuration and Operational Overview

Electron Source

The JEOL 2010 high-resolution TEM uses a high-brightness, single-crystal LaB6 filament as an electron source.


The 200-kV TEM is equipped with an ultrahigh resolution configuration: point-to-point resolution of 0.194 nm and lattice resolution of 0.14 nm. A microbeam diameter of 0.5 nm can be obtained that allows for nanobeam electron diffraction and CBED, as well as high-spatial resolution X-ray analysis.

Energy Dispersive Spectroscopy

The JEOL 2010 high-resolution TEM is equipped with an Oxford ISIS X-ray EDS microanalysis system. A Si(Li) detector with 136-eV energy resolution and a super atmosphere thin window is capable of detecting a wide range of elements from boron to uranium. The ISIS software can perform both qualitative and quantitative elemental analyses.

Gatan Image Filter

A Gatan image filter provides an optimized energy resolution of approximately 1.2 eV, and enables light element analysis by electron energy-loss spectroscopy and elemental mapping by electron spectroscopic imaging.

Digital Image Recording

In addition to standard negative film recording, the JEOL 2010 high-resolution TEM is equipped with a multiscan CCD camera (Gatan Model 794) for digital image recording with 1024 x 1024 pixel resolution. Images can be further analyzed using the Gatan digital micrograph, which not only processes images but also provides real-time diagnosis for TEM alignment. In addition, the instrument is also equipped with a television system (Gatan Model 622) that enables images to be displayed on a television monitor, which makes focusing and image astigmatism correction very easy.

Transmission Electron Microscope Samples Holders

The JEOL 2010 high-resolution TEM is equipped with two beryllium-cup low-background, double-tilt holders, one single-tilt standard holder, and one controlled atmosphere sample transfer holder, enabling the handing of specimens at inert gas environment, such as in nitrogen.

Image Analysis and Calculations

The TEM laboratory is also fitted with a range of image processing and calculation softwares, including Desktop Microscopist for diffraction pattern analysis and calculation, MacTempas for high-resolution TEM images and dynamical electron diffraction calculation, Crystal Maker for crystallographic modeling, Feff 8 for ELNES calculation.

Sample Preparation and Handling

The TEM laboratory is fully equipped with the standard thin-section preparation facilities:

Individuals who wish to use this instrument independently must have previous experience using a TEM.

Among others, this instrument has been used by EMSL researchers in the following collaborative external research activities:

  1. Syngas Conversion to Gasoline-Range Hydrocarbons over Pd/ZnO/Al2O3 and ZSM-5 Composite Catalyst System.
  2. In situ SEM and ToF-SIMS analysis of IgG conjugated gold nanoparticles at aqueous surfaces.
  3. Lithium Metal Anodes for Rechargeable Batteries.
  4. Characterization and modeling of the cemented sediment surrounding the Iulia Felix glass.
  5. Reduction Mechanism of Fluoroethylene Carbonate for Stable Solid–Electrolyte Interphase Film on Silicon Anode.
  1. Targeted strategies improve efficacy of enzymes to convert biomass to biofuels (Enzyme evaluation)
  2. Examining the core components of Arctic clouds to clear up their influence on climate (Forecast calls for better models)
  3. In silico, in vivo, in vitro approach opens doors for nanoparticle-based drug discovery (Model health)
  4. New knowledge about fungi biochemistry opens doors for better bioremediation options (Fungi clean up)
  5. Making fuel cells practical for large-scale commercial applications (Looking into the Atomic World of Fuel-Cell Catalysts)