Electron Microscope: Transmission, High Resolution
- Point-to-point resolution of 0.194 nm
- Operates in many lens conditions: TEM, EDS, NBED, and CBED
- Digital image recording with 1024 x 1024 pixel resolution
The JEOL 2010 high-resolution transmission electron microscope (TEM) is capable of a point-to-point resolution of 0.194 nm. The instrument can typically be used to image metals, ceramics, minerals, nanostructured materials, and biological-related materials and tissues at atomic-bond-length resolution. Researchers have used this instrument heavily for work related to spintronics, environmental issues, geophysics and geochemical research, atmospheric research, biological research, and catalysis.
This instrument is equipped with a medium acceleration voltage of 200 kV, a high-brightness electron source, digital image recording, a computer-controlled sample goniometer, and a geometrically optimized X-ray detector. It is also capable of a wide range of illumination lens conditions: TEM mode, energy dispersive spectroscopy (EDS) mode, nanometer beam electron diffraction (NBED), and convergent beam electron diffraction (CBED).
All work with the JEOL 2010 high-resolution TEM must be performed in compliance with EMSL practices and permits.
Primarily, the JEOL 2010 high-resolution TEM provides point-to-point resolution (0.194 nm) along with high-energy resolution (136 eV) X-ray EDS, the latter of which can detect elements heavier than beryllium. The instrument uses an LaB6 electron-beam source, and its slow-scan charge-coupled device (CCD) camera allows digital image recording and real-time image analysis.
System Configuration and Operational Overview
The JEOL 2010 high-resolution TEM uses a high-brightness, single-crystal LaB6 filament as an electron source.
The 200-kV TEM is equipped with an ultrahigh resolution configuration: point-to-point resolution of 0.194 nm and lattice resolution of 0.14 nm. A microbeam diameter of 0.5 nm can be obtained that allows for nanobeam electron diffraction and CBED, as well as high-spatial resolution X-ray analysis.
Energy Dispersive Spectroscopy
The JEOL 2010 high-resolution TEM is equipped with an Oxford ISIS X-ray EDS microanalysis system. A Si(Li) detector with 136-eV energy resolution and a super atmosphere thin window is capable of detecting a wide range of elements from boron to uranium. The ISIS software can perform both qualitative and quantitative elemental analyses.
Gatan Image Filter
A Gatan image filter provides an optimized energy resolution of approximately 1.2 eV, and enables light element analysis by electron energy-loss spectroscopy and elemental mapping by electron spectroscopic imaging.
Digital Image Recording
In addition to standard negative film recording, the JEOL 2010 high-resolution TEM is equipped with a multiscan CCD camera (Gatan Model 794) for digital image recording with 1024 x 1024 pixel resolution. Images can be further analyzed using the Gatan digital micrograph, which not only processes images but also provides real-time diagnosis for TEM alignment. In addition, the instrument is also equipped with a television system (Gatan Model 622) that enables images to be displayed on a television monitor, which makes focusing and image astigmatism correction very easy.
Transmission Electron Microscope Samples Holders
The JEOL 2010 high-resolution TEM is equipped with two beryllium-cup low-background, double-tilt holders, one single-tilt standard holder, and one controlled atmosphere sample transfer holder, enabling the handing of specimens at inert gas environment, such as in nitrogen.
Image Analysis and Calculations
The TEM laboratory is also fitted with a range of image processing and calculation softwares, including Desktop Microscopist for diffraction pattern analysis and calculation, MacTempas for high-resolution TEM images and dynamical electron diffraction calculation, Crystal Maker for crystallographic modeling, Feff 8 for ELNES calculation.
Sample Preparation and Handling
The TEM laboratory is fully equipped with the standard thin-section preparation facilities:
- Dimpler: The dimpler (VCR Group, Model D500i) is a special tool for preparing TEM samples, especially nonmetallic materials. This component has a magnetically coupled Z sensor that dynamically measures dimpled depth and activates Z termination. Together with interactive damping and balancing, it is capable of achieving a thickness of 5 μm at the center of samples.
- Ion Mill: The ion mill (PIPS 690, Gatan) is featured by two Ar ion guns with adjustable ion energy ranging from 1 keV to 5 keV. The beam-incident angle ranges from -10 degrees to +10 degrees. It can be operated in the modulated beam on/off mode and is suitable for cross-sectional thin section TEM specimen preparation.
- Tripod Polishers: Two tripod polishers (one from South Bay Technology, the other from Buehler) are special tools for cross-sectional sample preparation. They enable wedge shaped samples to be thinned down for TEM observation.
- Microtome: The Leica Ultracut UCT microtome is available for sectioning both biological and nonbiological material embedded in plastic. The thickness of sections can be selected in a range of 20 to 100 nm.
- Gatan ultrasonic 3-mm specimen cutter.
- South Bay Technology plasmon cleaner.
- Optical Microscope: The material science optical microscope (Olympus BX 60) consists of two light sources (reflection and transmission light), a polarizer and analyzer for both reflected and transmitted light, and a dual-photo system (CCD camera and Polaroid camera). Samples can be magnified from 50 to 3000 times the sample size. Digital images can be stored in a personal computer and printed on a photo-quality printer. The microscope is capable of brightfield, darkfield, and Nomarski DIC imaging.
Individuals who wish to use this instrument independently must have previous experience using a TEM.
Among others, this instrument has been used by EMSL researchers in the following collaborative external research activities:
- A researcher from Western Washington University and his students analyzed catalyst particle structures to correlate structural information to catalytic properties. This research is enabling a more complete understanding of the mechanism of improved catalytic properties.
- A researcher from the University of Washington characterized cobalt- and nickel-doped ZnO nanocrystals to determine structural and chemical information of the synthesized nanoparticles.
- A researcher from the University of Idaho analyzed the structure of nanometer-sized iron and iron-oxide particles. In addition, students of the researcher regularly use this instrument to analyze the structure of nanoparticles synthesized at their laboratory.
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