Microscope: Scanning Probe - AFM Compound
The atomic force microscope (AFM) compound microscope, is designed primarily for fluorescence imaging in the study of nanoscale chemical processes, such as interfacial electron transfer, organic thin film devices and cell membrane protein characterizations. This high-resolution, highly sensitive instrument provides correlated optical and topographical images, with the image resolution beyond the optical diffraction limit.
The instrument is equipped with a Nikon inverted microscope (Model: Diaphot); Digital Instrument AFM (Model: Bioscope); raster scanning device (constructed by PNNL researchers); and single photon counting detectors, including photon multiplier tubes and avalanche photodiodes.
Sample Preparation and Handling
Certain sample preparation and handling requirements must be followed when using this instrument, including placement of the sample on the microscope glass cover slip to ensure low optical distortion for high-resolution, high sensitivity optical imaging and flat substrate surface for AFM imaging.
Tip Fabrication
A variety of tips are available, including contact/noncontact-mode AFM tips and STM tips. Adding conductive layers on the AFM tips is also available by coating commercially available silicon-based AFM tips.
Researchers who have extensive experience and proficiency in the use of optical microscopy, fluorescence spectroscopy, and atomic force microscopy may use this instrument as needed for their research.
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