Electron Microscope: Transmission, Scanning
- Electron beam energy: 80 to 300 keV
- S/TEM-HAADF Point-to-Point Resolution at 300 kV: < 0.1 nm
- HRTEM Phase Contrast Resolution (information limit at 300 kV): < 0.1 nm
- EELS energy resolution (with monochromator on): 0.30 eV
- High-tilt Crystallographic and Tomographic Analysis
- Si(Li) X-ray energy dispersive spectrometer (XEDS)
- Cryogenic Imaging Capability
- Sample Tilt Range: -70°-+70°
- CCD camera : 2k x 2k
- Exit wave function reconstruction from defocus series
EMSL's aberration-corrected Titan 80-300™ scanning/transmission electron microscope (S/TEM) provides high-resolution imaging with sub-angstrom resolution and spectroscopic capabilities. This state-of-the-art instrument is equipped with a Schottky field-emission electron source, an electron gun monochromator, a CEOS hexapole spherical aberration corrector for the probe-forming lens, a high-angle annular dark-field (HAADF) detector, an X-Ray Spectrometer (EDS) and a high-resolution GIF. The selection of electron energy between 80kV and 300kV enables optimized imaging for a variety of materials, including electron beam sensitive materials.
Materials science and engineering – Microstructure and chemical composition of energy materials, ceramics, semiconductors, metals, alloys, and composites. Defect structure of materials.
Nanoscience and technology – Structure-function relationship in nanomaterials. Nucleation and growth, phase transformation, and interface structure in nanomaterials.
Chemistry – Particle-surface interactions, atomic level structure and chemistry, electronic structure, coordination chemistry, doping, valence state and charge transfer in catalytic materials.
Biogeochemistry – Mineral chemistry, microbial interactions with minerals, interface structure and chemistry across the soft and hard materials, biomineralization.
Environmental science – Aerosol structure and chemistry, trace analysis for environmental remediation, emission pollutant analysis.
EMSL's S/TEM Offers:
- Aberration-corrected S/TEM HAADF – provides direct structural imaging with sub-angstrom resolution
- High-resolution TEM (phase contrast) – atomic level imaging of light and heavy elements
- Energy-filtered imaging (EFTEM) – fast, large area elemental mapping, contrast tuning, chemical imaging
- 3-D tomographic imaging – morphology, structure, and chemical measurements
- Electron energy loss spectroscopy (EELS) with monochromated electron gun – chemical and electronic structure analysis with atomic level resolution, band gap measurement
- Energy-dispersive spectroscopy – chemical composition analysis
- Lorentz microscopy – study of magnetic materials
- Electron holographic imaging – imaging of electrical and magnetic fields, charge distribution.
For more information about this instrument and the science it will help enable, see the Scanning/Transmission Electron Microscopy (S/TEM) details page [.pdf, 92kb].
All Related Publications Related Publications
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- Multiband Optical Absorption Controlled by Lattice Strain in Thin-Film LaCrO3.
- Rotor Design for High Pressure Magic Angle Spinning Nuclear Magnetic Resonance.
- A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments.
All Related Research Highlights Related Research Highlights
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