Surface Analysis '12
- Registration is now open
- Abstract Due Date: April 15
- Post Deadline Poster: May 15
- Pre-Registration: June 15
- Manuscripts Due: August 23
Conference Shuttle schedule.
Chemical Imaging Workshop
Coupling Atom Probe Tomography with High-resolution Transmission Electron Microscopy
On June 19, 2012, join us at the Environmental Molecular Sciences Laboratory for a free full-day workshop dedicated to coupling atom probe tomography (APT) and high-resolution transmission electron microscopy (TEM). The workshop is is limited to the first 100 registrants and will include an associated tour and tutorial session with laboratory demonstrations (tour and lab demonstrations are limited to 32 participants), focusing on multi-modal chemical imaging using a combination of focused ion beam (FIB), scanning transmission electron microscopy (STEM), and APT.
Along with invited talks, the conference will feature a dedicated forum to discuss the possibility of combining APT with TEM into a single tool. Other aspects of developing new capabilities, such as cryogenic sample transfer, will be included in the discussion.
- Mike Miller - Oak Ridge National Laboratory
- Amanda Petford-Long - Argonne National Laboratory
- Brian Gorman - Colorado School of Mines
- Tom Kelly and Ty Prosa - Cameca Instruments, Inc.
|7:30 am - 8:15 am||Badging/Breakfast|
|8:15 am - 8:30 am||Welcome Remarks from EMSL Director Allison Campell and PNNL Chemical Imaging Initiative Lead Louis Terminello|
|8:30 am - 9:00 am||Overview of APT by Mike Miller (Corporate Fellow, ORNL)|
|9:00 am - 9:30 am||Overview of TEM by Amanda Petford-Long (Director, ANL-CNM)|
|9:30 am - 10:00 am||Potential New Directions for Combining APT and TEM by Tom Kelly (Division Vice-President, Cameca Instruments, Inc.)|
|10:15 am - 10:45 am||Coupling APT and STEM by Brian Gorman (Professor, Colorado School of Mines)|
|10:45 am - 11:15 am||Coupling APT and STEM by Arun Devaraj and Robert Colby (Scientists, EMSL)|
|11:15 am - 11:45 am||APT in Biological Applications by Ty Prosa (Senior Staff Scientist, Cameca Instruments, Inc.)|
|12:00 pm - 2:00 pm||Forum Discussion (Lunch included)|
|2:00 pm - 5:00 pm||*Laboratory Tour (EMSL's APT, FIB, and STEM capabilities)|
*Tour includes visits to the APT, STEM, FIB, and APT data analysis laboratories (approximately 45 minutes each). Opportunities to discuss the feasibility of APT/TEM analysis to specific materials of interest will be encouraged. Tour participants must have a valid security badge (see the registration and badging page). For more information and required forms, please contact Barbara Diehl at email@example.com.
To encourage student participation at Surface Analysis '12, PNWAVS will subsidize student accommodations. For details, contact Barbara Diehl at firstname.lastname@example.org.
Register for the workshop.